Atomic structure of cobalt doped copper ferrite thin film

Copper ferrite (CuFe₂O₄) has been well known because of its interesting physical properties, and it has been used as a candidate for many applications such as Li-ion storage, gas sensors, catalysts, and magnetic devices. Copper ferrite (CuFe₂O₄) structure is of significant importance in the context of engineered materials and their structure development due to the natural superlattice structure. In this work, copper ferrite (CuFe₂O₄) nanostructures with cobalt doped were prepared in the form on glass substrates by a spin-coating technique. The different doped amounts of cobalt (Co) doped copper ferrite thin films were used to prepare thin film at room temperature and then post-annealed at 500 °C in the air up to 5 hours. The nanostructures of fabricated thin films are characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS). The chemical composition of nanostructure in thin film form can be extracted XPS due to their surface sensitivities. The property modification by cobalt doping in copper ferrite (CuFe₂O₄) thin film was systematically investigated for various mixing ratios and post-anneal temperatures. It was found that the XPS spectra of copper 2p peak exhibited the significant change for the modified atomic arrangement of nanostructure thin film after etching.