TY - GEN
T1 - Analysis of field through apertures by applying transmission line matrix method to electromagnetic topology simulations
AU - Kirawanich, Phumin
AU - Gleason, David
AU - Cornell, Anthony
AU - Islam, N. E.
PY - 2005
Y1 - 2005
N2 - Results from finite difference time domain simulation were compared with electromagnetic topology based simulation technique using transmission line matrix method for field penetration through the sub-wavelength apertures. Simulations show that electromagnetic topology technique can be applied for the analysis of electromagnetic fields penetration through apertures. Analysis also shows that the aperture size affects the temporal characteristics and frequency spectral components of the incident pulse. In addition, electromagnetic topology method results a reduction in the calculation grid by this technique results in enhanced simulation speed and less memory utilization.
AB - Results from finite difference time domain simulation were compared with electromagnetic topology based simulation technique using transmission line matrix method for field penetration through the sub-wavelength apertures. Simulations show that electromagnetic topology technique can be applied for the analysis of electromagnetic fields penetration through apertures. Analysis also shows that the aperture size affects the temporal characteristics and frequency spectral components of the incident pulse. In addition, electromagnetic topology method results a reduction in the calculation grid by this technique results in enhanced simulation speed and less memory utilization.
KW - CRIPTE network simulation
KW - Electromagnetic topology
KW - System interaction
KW - Transmission line matrix
UR - https://www.scopus.com/pages/publications/33746622554
U2 - 10.1109/ISEMC.2005.1513650
DO - 10.1109/ISEMC.2005.1513650
M3 - Conference contribution
AN - SCOPUS:33746622554
SN - 0780393805
SN - 9780780393806
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 883
EP - 887
BT - 2005 International Symposium on Electromagnetic Compatibility, EMC 2005
T2 - 2005 International Symposium on Electromagnetic Compatibility, EMC 2005
Y2 - 8 August 2005 through 12 August 2005
ER -