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X-ray Diffractometer (XRD)

    Facility/equipment: Equipment

    Equipments Details

    Description

    This instrument is a powerful tool designed for structural characterization of a wide range of materials.
    It provides useful information including crystal phase, refined crystal parameters, structural orientation, crystallinity, crystallite size and residual stress.
    2theta ranging from 0.5 degree to 90 degree can be measured with available Cu and Mo X-ray tube.
    Advanced modes such as Grazing Incidence X-ray diffraction (GIXRD), texture and pole figures, and temperature control (30 °C to 800 °C) can be applied.
    Available database (PDF-2) can be accessed.

    Details

    NameBruker D8 DISCOVER

    Keywords

    • QC Physics
    • X-Ray
    • QE Geology
    • QD Chemistry

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