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Field Emission Scanning Electron Microscope (FE-SEM)

    Facility/equipment: Equipment

    Equipments Details

    Description

    This instrument is used for structure and surface analysis.
    It provides a 3D picture acquired from generating of electron signal:
    Secondary signal detector
    Backscattered electron
    It can accelerate voltage and magnify up to 30 kV and 1,000,000X, respectively.
    Elemental composition can be analyzed (Be to Pu) with Energy Dispersive X-ray spectroscopy (EDS).

    Details

    NameJEOL JSM-7610FPLUS

    Keywords

    • QR180 Immunology
    • QP Physiology
    • QD Chemistry

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