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Benchtop X-ray Diffractometer (XRD)

    Facility/equipment: Equipment

    Equipments Details

    Description

    This instrument is a versatile tool designed for structural characterization, providing useful information:
    Crystal phase
    Refined crystal parameters
    Structural orientation
    Crystallinity
    Crystallite size
    Residual stress
    2theta ranging from 0.5 degree to 90 degree can be measured with available Cu anode tube and compound silicon strip detector.
    Available database (PDF-2) can be accessed.

    Details

    NameBRUKER D2 PHASER

    Keywords

    • QC Physics
    • QD Chemistry
    • QE Geology

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