Atomic Force Microscope-Raman

This instrument is a state-of-the-art turn-key solution that combines optics and ultra-resolution multi-range AFM-Raman.
AFM imaging modes and Raman acquisition can be performed either sequentially or simultaneously at the same location on the sample surface.
Measuring modes including contact, non-contact, phase imaging, force modulation, nanolithography, etc. are available.
Major applications are:
Images of surface topography/roughness or surface morphology
Electrical, mechanical, magnetic, and thermal properties
Tip-enhanced Raman spectroscopy (TERS)
Phase shift and frequency shift images
Molecular resolution image