Equipments Details
Description
This instrument is used for monitoring the surface topography using interaction (atomic force) between the tip and sample surface.
Contact, non-contact, and tapping modes are available.
Potential applications are:
Images of surface topography/roughness or surface morphology
Electrical, mechanical, magnetic, and thermal properties
Distribution of nanofiber lengths or nanoparticle sizes
Width, depth, pitch, and angle measurements
Mono- or multi-layer thickness
Composition changes
Contact, non-contact, and tapping modes are available.
Potential applications are:
Images of surface topography/roughness or surface morphology
Electrical, mechanical, magnetic, and thermal properties
Distribution of nanofiber lengths or nanoparticle sizes
Width, depth, pitch, and angle measurements
Mono- or multi-layer thickness
Composition changes
Details
| Name | Park S systems NX20 |
|---|
Keywords
- QD Chemistry
- QC Physics
×
![]()
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.